Manufacturer:KLA Corporation
Model:KLA 5105
Module Type:Precision Measurement Module
Measurement Range:Sub-nanometer to millimeter
Resolution:Sub-nanometer
Accuracy:+/- 0.5% of reading
Repeatability:< 0.1% of reading
Operating Temperature:-20°C to +60°C
Power Supply:100-240V AC, 50/60Hz
Dimensions:25cm x 30cm x 15cm
Weight:5kg
The KLA KLA 5105 Advanced Inspection Module is a cutting-edge solution for semiconductor wafer inspection. Designed for precision and reliability, this module offers sub-50nm defect detection capabilities essential for modern semiconductor manufacturing. With high-resolution imaging, it ensures that even the smallest defects are identified and corrected, enhancing overall wafer quality. The integrated inspection software suite provides a comprehensive analysis platform, allowing technicians to monitor and optimize the inspection process efficiently. Operating at up to 200 wafers per hour, the KLA 5105 is built to handle high-volume production environments. Its robust design, weighing approximately 500kg, is built to withstand the rigorous demands of continuous operation. The KLA 5105 operates within a specific environmental range, requiring 220V AC power and ensuring stable performance under controlled conditions. Ideal for semiconductor fabrication facilities, this module is a vital tool for maintaining high standards of quality and efficiency.
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